发明名称 TESTER
摘要 PROBLEM TO BE SOLVED: To easily position a probe from a tester even for a fine circuit of a device under test. SOLUTION: The tester 100 has input ports 105, 115 having an input terminal for receiving test signals from a probe 300 and a power output terminal for feeding power, respectively. The input terminal is also available for receiving video signals, and a display 110 of the tester displays pictures provided by the video signals and waveform tracks of test signals. A camera 200 fed with an operating power from the power output terminal of the tester supplies video signals to the input terminal of the tester.
申请公布号 JP2002303640(A) 申请公布日期 2002.10.18
申请号 JP20010323885 申请日期 2001.10.22
申请人 TEKTRONIX INC 发明人 TALLMAN JAMES L;KAWABATA FREDERICK Y;CLIMER EUGENE J;NIGHTINGALE MARK W
分类号 G01R1/06;G01R13/20;G01R31/309;(IPC1-7):G01R13/20 主分类号 G01R1/06
代理机构 代理人
主权项
地址