发明名称 X-ray reflectometer
摘要 Reflectometry apparatus includes a radiation source, adapted to irradiate a sample with radiation over a range of angles relative to a surface of the sample, and a detector assembly, positioned to receive the radiation reflected from the sample over the range of angles and to generate a signal responsive thereto. A shutter is adjustably positionable to intercept the radiation, the shutter having a blocking position, in which it blocks the radiation in a lower portion of the range of angles, thereby allowing the reflected radiation to reach the array substantially only in a higher portion of the range, and a clear position, in which the radiation in the lower portion of the range reaches the array substantially without blockage.
申请公布号 US2002150208(A1) 申请公布日期 2002.10.17
申请号 US20010833902 申请日期 2001.04.12
申请人 YOKHIN BORIS;DIKOPOLTSEV ALEXANDER;MAZOR ISAAC;BERMAN DAVID 发明人 YOKHIN BORIS;DIKOPOLTSEV ALEXANDER;MAZOR ISAAC;BERMAN DAVID
分类号 G01B15/02;G01N23/20;G01N23/223;G01T1/36;(IPC1-7):G01T1/36 主分类号 G01B15/02
代理机构 代理人
主权项
地址