发明名称 Substrate processing method and substrate processing system
摘要 The present invention relates to a processing method for processing a substrate, and comprises a step of coating a coating solution on a surface of the substrate while relatively moving a coating solution discharge nozzle and the substrate and discharging the coating solution from the nozzle onto the substrate. Thereafter, the substrate is exposed to a solvent atmosphere of the coating solution or the pressure is temporarily applied thereto in a container. Thereafter, the pressure inside the container in which the substrate is housed is reduced to dry the coating solution on the substrate. According to the present invention, it is possible to narrow the so-called edge cutting width, which is at a periphery part of the substrate and is not commercialized, and to maintain an in-plane uniformity of the coating film.
申请公布号 US2002150691(A1) 申请公布日期 2002.10.17
申请号 US20020121612 申请日期 2002.04.15
申请人 TOKYO ELECTRON LIMITED 发明人 KITANO TAKAHIRO;SUGIMOTO SHINICHI;KOBAYASHI SHINJI;HIRAKAWA NAOYA;FUKUTOMI AKIRA;ISHIZAKA NOBUKAZU
分类号 H01L21/027;B05D3/04;G03F7/16;H01L21/00;(IPC1-7):B05D1/02 主分类号 H01L21/027
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