发明名称 Ic resistor and capacitor fabrication method
摘要 <p>An IC resistor and capacitor fabrication method comprises depositing a dielectric layer (14) over existing active devices and metal interconnections on an IC substrate (10). In a preferred embodiment, a layer of thin film material (16) suitable for the formation of thin film resistors is deposited next, followed by a metal layer (18) that will form the bottom plates of metal-dielectric-metal capacitors. Next, the capacitors' dielectric layer (20) is deposited to a desired thickness to target a particular capacitance value, followed by the deposition of another metal layer (22) that will form the capacitors' top plates. The metal layers, the capacitor dielectric layer, and the thin film material layer are patterned and etched to form TFRs (36) and metal-dielectric-metal capacitors (38) as desired on the IC substrate The method may be practiced using any of several alternative process sequences. For example, the bodies of the TFRs can be formed before the deposition of the capacitors' layers. Also, the capacitors' bottom plates may be patterned and etched prior to doing the same for their top plates. <IMAGE> <IMAGE></p>
申请公布号 EP1248287(A2) 申请公布日期 2002.10.09
申请号 EP20020252420 申请日期 2002.04.03
申请人 ANALOG DEVICES, INCORPORATED 发明人 HUPPERT, GILBERT;DELAUS, MICHAEL, D.;GLEASON, EDWARD
分类号 H01L21/02;H01L27/06;(IPC1-7):H01L21/02;H01L21/822 主分类号 H01L21/02
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