发明名称 PROCESSING METHOD AND PROCESSING DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To solve the problem in diagnosing the flow rate of a flow control device wherein flow diagnosis is required at the intermission of the processing of a body to be processed, such as, for example, the switching time of a lot, the starting time of a device or the like, by providing a process exclusive for the flow diagnosis, and a throughout is lowered. SOLUTION: In this processing device, when process gas is supplied into a chamber 30 at a prescribed flow rate and a wafer W is processes in the chamber 30, the flow rate of the process gas is diagnosed at every processing time of the wafer W by the process gas.</p>
申请公布号 JP2002296096(A) 申请公布日期 2002.10.09
申请号 JP20010100420 申请日期 2001.03.30
申请人 TOKYO ELECTRON LTD 发明人 TAKAHASHI EIJI;MIZUSAWA KANEYOSHI;HIROSE JUN
分类号 G01F1/00;C23C16/52;G01F1/42;G01F11/28;G01F15/04;G01F25/00;G05B23/02;G05D7/06;(IPC1-7):G01F25/00 主分类号 G01F1/00
代理机构 代理人
主权项
地址
您可能感兴趣的专利