发明名称 BIT-LINE CONTACT AND FORMING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a bit-line contact and formation method thereof for a vertical DRAM array, using a bit-line contact mask. SOLUTION: In this method, a gate conductor line is formed. An oxide layer 35 is adhered to the gate conductor line, and a bit-line contact mask 40 is formed on a part of the oxide layer 35. The bit-line contact mask 40 is etched, and a silicon layer 45 is made to stick on a substrate 5. A bit-line layer 50 is adhered to the silicon layer 45. Masking and etching processes are carried out with a bit-line layer 50. An M0 metal 60 is made to adhere to the silicon layer 45, as well as on both sides of non-etching part of the bit-line (M0) layer 50, and forms the left and right bit lines.
申请公布号 JP2002270700(A) 申请公布日期 2002.09.20
申请号 JP20020002654 申请日期 2002.01.09
申请人 INTERNATL BUSINESS MACH CORP <IBM>;INFINEON TECHNOL NORTH AMERICA CORP 发明人 NESBIT LARRY A;FALTERMEIER JOHNATHAN E;RAMACHANDORA DEIVAKARUNI;BERGNER WOLFGANG
分类号 H01L21/768;H01L21/28;H01L21/60;H01L21/8242;H01L27/108 主分类号 H01L21/768
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