发明名称 |
Method for forming a capacitor in a mixed mode circuit device by ion implantation |
摘要 |
The invention provides a method for forming a capacitor in a mixed mode circuit device through ion implantation. The method includes forming a polysilicon layer over a substrate, which substrate has isolation region formed thereon. An ion implantation process is performed to implant oxygen ions into the polysilicon layer. An annealing process is performed to trigger an reaction between the oxygen ions and the silicon ions. As a result, a silicon oxide layer is formed within the polysilicon layer. The silicon layer and the polysilicon layer are patterned, where the top portion of the polysilicon layer above the silicon oxide layer serves as an upper electrode of a capacitor. The polysilicon layer below the silicon oxide layer serves as the lower electrode.
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申请公布号 |
US6444519(B1) |
申请公布日期 |
2002.09.03 |
申请号 |
US20020120286 |
申请日期 |
2002.04.09 |
申请人 |
MACRONIX INTERNATIONAL CO., LTD. |
发明人 |
LIU CHIEN-HUNG;HUANG SHOU-WEI;PAN SHYI-SHUH |
分类号 |
H01L21/02;H01L21/265;H01L21/321;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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