发明名称 Methods of forming low resistivity titanium silicide structures
摘要 Methods and apparatus for forming a conductor layer utilize an implanted matrix to form C54-titanium silicide. Word line stacks formed by the methods of the invention are used in sub-0.25 micron line width applications, interconnects, and silicided source/drain regions, among other applications, and have a lower resistivity and improved thermal stability.
申请公布号 US6444579(B1) 申请公布日期 2002.09.03
申请号 US19980028876 申请日期 1998.02.24
申请人 MICRON TECHNOLOGY, INC. 发明人 HU YONGJUN
分类号 H01L21/28;(IPC1-7):H01L21/44 主分类号 H01L21/28
代理机构 代理人
主权项
地址