发明名称 SEMICONDUCTOR DEVICE AND ITS FABRICATING METHOD
摘要 PROBLEM TO BE SOLVED: To form a high performance resistive element region. SOLUTION: The semiconductor device having a plurality of element regions and isolation regions formed on a semiconductor substrate comprises gate electrodes formed in specified element regions among the plurality of element regions, first insulation layers 3a and 3b covering the side wall face of the gate electrodes, and second insulation layers 4a and 4b covering the surface of the first insulation layers wherein the element regions not formed with the gate electrode are covered with the first insulation layer 3.
申请公布号 JP2002198437(A) 申请公布日期 2002.07.12
申请号 JP20000392560 申请日期 2000.12.25
申请人 TOSHIBA CORP 发明人 NISHIGORI MASATO
分类号 H01L27/04;H01L21/822;H01L21/8234;H01L27/06;H01L27/08;(IPC1-7):H01L21/823 主分类号 H01L27/04
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