| 摘要 |
<p>An LSI test device comprising a power supply unit for supplying a dc power supply voltage to an electronic device, a detection unit for detecting a power supply current supplied from the power supply unit to the electronic device, and a judging unit for judging the quality of the electronic device, wherein the power supply unit has means of superimposing a superimposing signal with a specific frequency onto a power supply voltage, and the judging unit judges the quality of the electronic device based on a power supply current detected by the detection unit when superimposing signal-superimposed power supply voltage is supplied to the electronic device.</p> |
