| 发明名称 |
Simultaneous testing of multiple optical circuits in substrate |
| 摘要 |
An improved method and apparatus for testing an optical circuit simultaneously contacts and allows testing of a plurality of optical circuits in a substrate before the optical circuits are cut from the substrate.
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| 申请公布号 |
US2002084793(A1) |
申请公布日期 |
2002.07.04 |
| 申请号 |
US20000752171 |
申请日期 |
2000.12.29 |
| 申请人 |
HUNG HENRY H.;ANJAN YELLAPU;EL-WAILLY TAMIM |
发明人 |
HUNG HENRY H.;ANJAN YELLAPU;EL-WAILLY TAMIM |
| 分类号 |
G01R31/28;(IPC1-7):G01R31/308 |
主分类号 |
G01R31/28 |
| 代理机构 |
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