METHOD FOR MANUFACTURING SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

摘要

PROBLEM TO BE SOLVED: To solve the problem that a testing circuit in a chip applied by a conventional test facilitation designing technique must inspect whether an input/ output circuit for outputting a signal to an external terminal or capturing a signal from an external terminal is normally operated or not by using a circuit tester. SOLUTION: A method for manufacturing a semiconductor integrated circuit device comprises the steps of providing a wiring capable of connecting an arbitrary chip or between devices, a variable switch circuit capable of connecting between prescribed wirings on a wafer formed with a microcomputer containing chip for containing a CPU, and a memory circuit capable of wiring to store an operating program or a test board in which a microcomputer mounting device sealed in a package is mounted; writing the program for test including a transmitting and receiving operation of the signal with another chip or the device in the memory circuit usable as a program storage area in any one chip or device and rewritable; and executing the test program by a CPU of the chip or device.