发明名称 ANALYTICAL METHOD FOR IMPURITIES IN ORGANOMETALLIC COMPOUND
摘要 PROBLEM TO BE SOLVED: To provide an analytical method, for impurities in an organometallic compound, in which the impurities in the organometallic compound, especially impurities other than metal impurities such as gas impurities or the like, can be analyzed with satisfactory accuracy. SOLUTION: In the analytical method, a metal M in the organometallic compound MR(M: metal and R: organic group) containing the impurities is chemically adsorbed to a carrier in which alumina, silica gel, dimethyl silicon or phenylmethylsilicon is carried by diatomaceous earth, and the impurities are then analyzed.
申请公布号 JP2002181797(A) 申请公布日期 2002.06.26
申请号 JP20000376625 申请日期 2000.12.11
申请人 OSAKA OXYGEN IND LTD 发明人 NAKAMURA MASAKAZU;OKI MASAHIRO;HASHIMOTO TAIJI
分类号 G01N30/00;B01J20/281;G01N30/88;(IPC1-7):G01N30/00;G01N30/48 主分类号 G01N30/00
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