发明名称 Semiconductor varactor with reduced parasitic resistance
摘要 A semiconductor varactor with reduced parasitic resistance. A contact isolation structure (32) is formed in a well region (20). The gate contact structures (70) are formed above the contact isolation structure (32) reducing the parasitic resistance. In addition, contact structures are formed on the gate layer (50) over the well regions (20) is a further embodiment to reduce the parasitic resistance.
申请公布号 US2002074589(A1) 申请公布日期 2002.06.20
申请号 US20010994421 申请日期 2001.11.27
申请人 BENAISSA KAMEL;SHEN CHI-CHEONG 发明人 BENAISSA KAMEL;SHEN CHI-CHEONG
分类号 H01L27/08;H01L29/94;(IPC1-7):H01L27/108 主分类号 H01L27/08
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