发明名称 APPEARANCE INSPECTION DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide an appearance inspection device capable of reducing the influence of vibration in the appearance inspection, and preventing the occurrence of a pseudo defect. SOLUTION: A recessed part 3a is formed on the upper surface of a surface plate 3, and an XY stage 2 is installed on the surface plate 3 across the recessed part 3a, and an opening part 22d is formed on a table 22c of the XY stage 2, and a photomask 1 which is an inspection object is loaded so as to cover the opening part 22d. A laser microscope including an objective lens 5 and a laser head 6 is installed on the surface plate 3, and the laser microscope is arranged on roughly the same horizontal plane as the XY stage 2, and the objective lens 5 is arranged on the bottom surface of the recessed part 3a of the surface plate 3 so as to be faced to the under surface of the photomask 1 through the opening part 22d.</p>
申请公布号 JP2002168796(A) 申请公布日期 2002.06.14
申请号 JP20000363637 申请日期 2000.11.29
申请人 NEC CORP 发明人 IKETA TAKAHIRO
分类号 G01B11/24;G01N21/956;G03F1/84;(IPC1-7):G01N21/956;G03F1/08 主分类号 G01B11/24
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