发明名称 SYSTEM FOR INSPECTING AND CLASSIFYING THIN PLATE-SHAPED SEMICONDUCTOR PART ITEM
摘要 PROBLEM TO BE SOLVED: To improve operating efficiency by shortening the time until classifying and storing a solar battery cell 30 for each rank on the basis of the ranking result by an inspection device 21. SOLUTION: An operation of storing the solar battery cell 30 conveyed successively into a storing part 23 and an operation of taking out the solar battery cell from a conveying part 25 can be simultaneously carried out, because the solar battery cell 30 can be temporarily stored into a buffer part 31 of a stock part 24 from a conveying part 25 through an intake means 34. Thereby, the solar battery cell 30 can be taken out from the inspection device 21 in spite of storing the solar battery cell 30 in the storing part 23. Accordingly, the solar battery cell 30 can be stored in the storing part 23 without stopping a first conveying means 22 and the intake means 34, and thus the operation rate of the device can be improved.
申请公布号 JP2002166234(A) 申请公布日期 2002.06.11
申请号 JP20010182320 申请日期 2001.06.15
申请人 SHARP CORP 发明人 YAGI KATSUYUKI;HONDA MASAYUKI
分类号 G01R31/26;B07C5/344;B07C5/38;B65G1/00;H01L21/677;H01L21/68;(IPC1-7):B07C5/38 主分类号 G01R31/26
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