APPARATUS AND METHOD FOR CONTROLLING TEST TEMPERATURE FOR SEMICONDUCTOR CIRCUIT

摘要

PURPOSE: An apparatus and a method for controlling a test temperature for a semiconductor circuit is provided to measure accurately an internal temperature of the semiconductor circuit by using a turn-on voltage of a diode. CONSTITUTION: A voltage meter portion(20) is used for generating a turn-on voltage(Vturn_on) through a diode in response to predetermined current generated from an input/output portion(10). A comparison portion(30) is used for receiving the turn-on voltage(Vturn_on) from the voltage meter portion(20) and calculating a variation of temperature by comparing the turn-on voltage(Vturn_on) with a reference voltage. A temperature control portion(40) is used for controlling temperature of a semiconductor circuit by transmitting temperature information(Temp) to the input/output portion(10) according to temperature information(Info_tem) generated from the comparison portion(30).