发明名称 CONTROLLED METHOD FOR DEPOSITING SILICON-RICH OXIDE USING HDP-CVD
摘要 PURPOSE: A controlled method for depositing silicon-rich oxide using HDP-CVD and its apparatus are provided to achieve increased consistency in layer uniformity. CONSTITUTION: A high density plasma chemical vapor deposition(HDP-CVD) system(10) in which a dielectric layer can be deposited. The system(10) includes a chamber(13), a vacuum system(70), a source plasma system(80A), a bias plasma system(80B), a gas delivery system(33), and a remote plasma cleaning system(50). The upper portion of chamber(13) includes a dome(14), which is made of a ceramic dielectric material, such as aluminum oxide or aluminum nitride. Dome(14) defines an upper boundary of a plasma processing region(16). Plasma processing region(16) is bounded on the bottom by the upper surface of a substrate(17) and a substrate support member(18). A heater plate(23) and a cold plate(24) surmount, and are thermally coupled to, dome(14). Heater plate(23) and cold plate(24) allow control of the dome temperature to within about +/- 10 deg.C over a range of about 100 deg.C to 200 deg.C. This allows optimizing the dome temperature for the various processes.
申请公布号 KR20020032397(A) 申请公布日期 2002.05.03
申请号 KR20010066046 申请日期 2001.10.25
申请人 APPLIED MATERIALS INC. 发明人 KAPOOR BIKRAM;ROSSMAN KENT
分类号 C23C16/507;C23C16/02;C23C16/40;H01L21/31;H01L21/316;(IPC1-7):H01L21/205 主分类号 C23C16/507
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