SEMICONDUCTOR INTEGRATED CIRCUIT

摘要

PROBLEM TO BE SOLVED: To select a mode and to evaluate the limit of the operation of an internal circuit only with a testing source voltage applied in test mode. SOLUTION: This circuit is applicable to the test mode only by a combination of a testing power source terminal 7 and a mode decision control circuit 12 without combining a power source switching circuit 5 and a power source control terminal 8 with the testing power source terminal 7. The functions of two terminals, i.e., the testing power source terminal 7 and power source control terminal 8 are integrated into the testing power source terminal 7 to simplify the circuit constitution and also improve the mounting density on a circuit board.