| 摘要 |
PROBLEM TO BE SOLVED: To compare a negative power source voltage generated by a power source tuning circuit with a comparison potential for decision in a semiconductor integrated circuit device. SOLUTION: This semiconductor integrated circuit device has the power generation circuit 10 including fuses blown to generate a required internal voltage and generating a pseudo internal power source voltage by realizing a pseudo blow state of the fuses in response to a tuning signal. A capacitor 7 and a switch circuit 9 convert the negative power source voltage VIN generated by the power generating circuit 10 into a positive potential, and a current mirror circuit 8 compares the converted positive potential with the prescribed comparison potential VA.
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