发明名称 |
Production of an active region over a deep trench capacitor comprises forming a capacitor in a semiconductor substrate, structuring and etching to form the active region, and wet etching the capacitor and the active region |
摘要 |
Production of an active region over a deep trench capacitor comprises forming a capacitor in a semiconductor substrate; structuring and etching the substrate to form the active region so that a part of the active region overlaps with the capacitor; and wet etching the capacitor and the active region. Preferred Features: Wet etching is carried out using ethylene glycol, NH4OH or an etchant having a high selectivity between doped polysilicon and the substrate. Wet etching is carried out for 5-20 minutes. The capacitor is produced by forming a trench in the substrate and forming a stacked capacitor in the trench.
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申请公布号 |
DE10046302(A1) |
申请公布日期 |
2002.04.18 |
申请号 |
DE20001046302 |
申请日期 |
2000.09.19 |
申请人 |
PROMOS TECHNOLOGIES, INC. |
发明人 |
WU, CHAO-CHUEH;WANG, HSIAO-LEI |
分类号 |
H01L21/8242;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8242 |
代理机构 |
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