Test device for high frequency testing of fast integrated circuits has low and high frequency communications connections, arrangement for producing and receiving high frequency test signals

摘要

The device has connections for low frequency or LF signal communications with test equipment, especially for acquiring LF test signals such as data, control, address and clock signals, an arrangement for producing high frequency or HF test signals based on incoming LF test signals and second connections for HF signal communications with a circuit under test, especially for outputting HF test signals and receiving response signals from the circuit. The device has first connections (32a,32b) for low frequency signal communications with a test equipment (40), especially for acquiring low frequency test signals such as data, control, address and clock signals, an arrangement (38) for producing high frequency test signals based on incoming low frequency test signals and second connections (34a-34d) for high frequency signal communications with a circuit under test (52), especially for outputting high frequency test signals and receiving response signals from the circuit.