发明名称 |
MEMORY CELL, MEMORY CELL DEVICE AND METHOD FOR THE PRODUCTION THEREOF |
摘要 |
Each memory cell is a memory transistor which is provided with a gate electrode (2) on the upper surface of a semiconductor body. Said gate electrode is disposed in a trench between a source area (3) and a drain area (4) which are formed in the semiconductor material. The gate electrode is separated from the semiconductor material by dielectric material. A series of oxide nitride-oxide layers is disposed between the source area and the drain area and between the drain area and the gate electrode in order to capture charge carriers on the source and drain. |
申请公布号 |
WO0215276(A2) |
申请公布日期 |
2002.02.21 |
申请号 |
WO2001DE02997 |
申请日期 |
2001.08.06 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
PALM, HERBERT;WILLER, JOSEF;GRATZ, ACHIM;KRIZ, JAKOB;ROEHRICH, MAYK |
分类号 |
H01L21/8247;H01L21/336;H01L21/8246;H01L27/115;H01L29/788;H01L29/792 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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