发明名称 METHOD FOR FORMING WORDLINE SPACER OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming a wordline spacer of a semiconductor device is provided to simplify and stabilize a manufacturing process, by forming spacers having the same structure and different thicknesses at one time. CONSTITUTION: After a wordline(1) is formed on a semiconductor substrate, a thin insulation layer(6) is evaporated on the resultant structure. A nitride layer(7) is evaporated on the resultant structure by a plasma enhanced chemical vapor deposition(PECVD) method. The nitride layer and the insulation layer are etched by an anisotropic etch process to simultaneously form the spacers in a cell region and a peripheral circuit region.
申请公布号 KR20020002709(A) 申请公布日期 2002.01.10
申请号 KR20000036961 申请日期 2000.06.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, HYEONG DEOK;LEE, CHAN YONG
分类号 H01L21/3213;(IPC1-7):H01L21/321 主分类号 H01L21/3213
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