发明名称 |
METHOD FOR FORMING WORDLINE SPACER OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for forming a wordline spacer of a semiconductor device is provided to simplify and stabilize a manufacturing process, by forming spacers having the same structure and different thicknesses at one time. CONSTITUTION: After a wordline(1) is formed on a semiconductor substrate, a thin insulation layer(6) is evaporated on the resultant structure. A nitride layer(7) is evaporated on the resultant structure by a plasma enhanced chemical vapor deposition(PECVD) method. The nitride layer and the insulation layer are etched by an anisotropic etch process to simultaneously form the spacers in a cell region and a peripheral circuit region.
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申请公布号 |
KR20020002709(A) |
申请公布日期 |
2002.01.10 |
申请号 |
KR20000036961 |
申请日期 |
2000.06.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, HYEONG DEOK;LEE, CHAN YONG |
分类号 |
H01L21/3213;(IPC1-7):H01L21/321 |
主分类号 |
H01L21/3213 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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