发明名称 |
A METHOD AND SYSTEM FOR PROCESSING INTEGRATED CIRCUITS |
摘要 |
A circuit and a method for automatically detecting an operating condition of an integrated circuit chip and for automatically outputting a control signal in response to automatically detecting one of at least two said operating conditions. With the preferred embodiment of the invention, FET off currents are reduced during burn-in of a CMOS integrated chip. This is done by a compact, local sensing circuit. The sensing circuit is off during the normal chip operation, and the sensing circuit is only used where needed to provide a local signal to cut down excessive FET off currents. The sensing circuit preferred embodiment is designed with an NFET bandgap device that employs a novel layout approach.
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申请公布号 |
US2002003430(A1) |
申请公布日期 |
2002.01.10 |
申请号 |
US19990273895 |
申请日期 |
1999.03.22 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
BRYANT ANDRES;CLARK WILLIAM;NOWAK EDWARD J;TONG MINH H |
分类号 |
G01R31/28;G01R31/30;(IPC1-7):G01R31/02 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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