发明名称 Method of fabricating self-aligned multilevel mask ROM
摘要 A method of fabricating self-aligned multilevel mask read only memory (ROM). The method can improve the process window to reduce process difficulty by utilizing the self-aligned implantation. Moreover, by utilizing the height difference between different gate polysilicon layers and implantation of the ROM code with self-aligned implatiation to increase the difference between the threshold voltages of different gates, and therefore, multilevel cell transistors with for the mask ROM with multilevel threshold voltages are formed to times the capacity of the mask ROM.
申请公布号 US6319781(B1) 申请公布日期 2001.11.20
申请号 US20010794146 申请日期 2001.02.28
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 LEE CHUNG YEH;JENG PEI-REN
分类号 H01L21/8246;H01L27/112;(IPC1-7):H01L21/823 主分类号 H01L21/8246
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