| 摘要 |
PROBLEM TO BE SOLVED: To solve the problem that the non-overlapped section of a bi-phase non-overlapping clock cannot be adjusted without increasing power consumption and spurious radiation, and fluctuation in each chip cannot be eliminated in a manufacturing process. SOLUTION: Creation, measurement, and write processes are included. In the creation process, a semiconductor integrated circuit is created, where the semiconductor integrated circuit has first and second delay circuits, and a delay control register that changes each delay time of the first and second delay circuits according to written data. In the measurement process, the non- overlapped section of the semiconductor integrated circuit is measured. In the write process, data that is determined based on the measurement result is written into the delay control register.
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