发明名称 Spatially resolved temperature measurement and irradiance control
摘要 A method, apparatus and system for producing a desired spatial temperature distribution across a workpiece. The method includes irradiating a plurality of areas on a surface of the workpiece to create localized heating of the workpiece in those areas, to produce the desired spatial temperature distribution in the workpiece, and the apparatus includes means for carrying out the method. The system includes a locator for locating the workpiece in a desired position relative to an energy source, and an irradiance system for carrying out the method. The system further includes a processor circuit in communication with the irradiance system, and a radiation-absorbing environment. The irradiance system includes a measuring system and at least one energy source for directing radiation to the surface of the workpiece.
申请公布号 US2001036219(A1) 申请公布日期 2001.11.01
申请号 US20010879519 申请日期 2001.06.12
申请人 CAMM DAVID MALCOLM;LEFRANCOIS MARCEL EDMOND;HICKSON BRENDON JAMES 发明人 CAMM DAVID MALCOLM;LEFRANCOIS MARCEL EDMOND;HICKSON BRENDON JAMES
分类号 H01L21/00;(IPC1-7):H01L21/00;G01K3/00 主分类号 H01L21/00
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