发明名称 Method for operating a ferroelectric memory configuration and a ferroelectric memory configuration
摘要 The invention relates to a method for operating a ferroelectric memory configuration in the VDD/2 mode. The memory configuration has a large number of memory cells which each have at least one selection transistor, one storage capacitor with an upper and a lower electrode and one short-circuiting transistor whose source-drain junction is connected in parallel with the storage capacitor. After a read or write procedure in which the memory cells are driven via respectively associated word lines and via respectively associated bit lines which are precharged in a precharge phase, the short-circuiting transistor is driven during a standby phase and in the process short-circuits the electrodes in the storage capacitor. The method is characterized in that the time of the standby phase coincides with the time of the precharge phase and, in the process, the bit lines are at a different potential with respect to that of the two electrodes of the storage capacitor.
申请公布号 US2001036099(A1) 申请公布日期 2001.11.01
申请号 US20010826232 申请日期 2001.04.04
申请人 HONIGSCHMID HEINZ;ROHR THOMAS 发明人 HONIGSCHMID HEINZ;ROHR THOMAS
分类号 G11C11/22;H01L21/8246;H01L27/105;(IPC1-7):G11C11/22 主分类号 G11C11/22
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