发明名称 Ideal oxygen precipitating epitaxial silicon wafers and oxygen out-diffusion-less process therefor
摘要 A process for preparing an silicon epitaxial wafer. The wafer has a front surface having an epitaxial layer deposited thereon, a back surface, and a bulk region between the front and back surfaces, wherein the bulk region contains a concentration of oxygen precipitates. In the process, a wafer having interstitial oxygen atoms is first subjected to an oxygen precipitation heat treatment to cause the nucleation and growth of oxygen precipitates to a size sufficient to stabilize the oxygen precipitates. An epitaxial layer is then deposited on the surface of the oxygen precipitate stabilized wafer.
申请公布号 US6306733(B1) 申请公布日期 2001.10.23
申请号 US20000626635 申请日期 2000.07.27
申请人 MEMC ELECTRONIC MATERIALS, SPA 发明人 FALSTER ROBERT;CORNARA MARCO;GAMBARO DANIELA;OLMO MASSIMILIANO
分类号 C30B29/06;H01L21/26;H01L21/322;(IPC1-7):H01L21/322 主分类号 C30B29/06
代理机构 代理人
主权项
地址