发明名称 System for avoiding electromigration in LSI circuits
摘要 A system is provided which has proved to be advantageous in avoiding electromigration-induced failure problem. Electric current density along a path along which a condutor line lies is determined by calculation. When the determined electric current density is not less than a predetermined value, a buffer is automatically inserted into the path.
申请公布号 US6308310(B1) 申请公布日期 2001.10.23
申请号 US19980004329 申请日期 1998.01.08
申请人 NEC CORPORATION 发明人 NAKAMURA KAZUSHI
分类号 G06F17/50;H01L21/82;H01L21/822;H01L27/04;H03K19/003;(IPC1-7):H03K17/16 主分类号 G06F17/50
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