发明名称 CONFORMING METHOD OF SCANNING BIST ARCHITECTURE TO LOW ELECTRIC POWER OPERATION AND SCANNING BIST TESTING CONSTITUTION
摘要 PROBLEM TO BE SOLVED: To provide scanning BIST architecture to be conformed to low electric power scanning BIST architecture. SOLUTION: A generator 102, a compressor 106 and a controller 110 are the same as in a conventional technology. The difference between the scanning BIST architecture of the conventional technology and the low electric power scanning BIST architecture is that a known scanning passage is corrected to a scanning passage 502 and an adapter circuit 504 is inserted into a control passage 114 between the controller 110 and the scanning passage 502 for inserting a scanning passage A506, a scanning passage B508 and a scanning passage C510.
申请公布号 JP2001289908(A) 申请公布日期 2001.10.19
申请号 JP20010066990 申请日期 2001.03.09
申请人 TEXAS INSTR INC <TI> 发明人 WHETSEL LEE D
分类号 G01R31/28;G01R31/317;G01R31/3185 主分类号 G01R31/28
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