发明名称 ELEMENT ANALYZING SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide an element analyzing system capable of efficiently deciding an internal standard element. SOLUTION: The element analyzing system analyzes an element by ionizing a sample by a plasma. The system comprises a means for adding the internal standard element to be judged to a mixture solution obtained by combining a standard solution having a known concentration of the object element to be measured, the sample to be measured, the standard solution and the sample to be measured, measuring and judging whether the added internal standard element is suitable or not from the measured result of the object element and the internal standard element of the solutions. Thus, a decision of the internal standard element can be simply conducted. Its time and man-power can be suppressed to minimum limits. Further, reliability of an analyzed value can be improved.
申请公布号 JP2001289821(A) 申请公布日期 2001.10.19
申请号 JP20000106689 申请日期 2000.04.04
申请人 HITACHI LTD;HITACHI SCI SYST LTD 发明人 SAKAMOTO HIDEYUKI;SHIRASAKI TOSHIHIRO;YONETANI AKIRA;YAMAMOTO KAZUKO;TERUI YASUSHI
分类号 G01N27/62;G01N30/72;G01N30/82;G01N30/86;(IPC1-7):G01N27/62 主分类号 G01N27/62
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