| 摘要 |
PROBLEM TO BE SOLVED: To provide a delay profile measurement device that uses a device and a material easily acquired so as to simply measure the delay profile of an OFDM wave. SOLUTION: The delay profile measurement device is characterized in the provision of an antenna 1 that receives an OFDM wave, of an analysis means 3 that receives a received signal of the antenna to analyze an amplitude destination characteristic, and of an arithmetic means 5 that obtains delay time and DU ratio of a multi-path delayed wave, on the basis of data resulting from the analysis by the analysis means.
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