发明名称 ANALYTIC SHAPE CORRECTION METHOD IN MEASUREMENT OF RELATIVE SHAPE OF SURFACE TO BE INSPECTED
摘要 PROBLEM TO BE SOLVED: To achieve a higher accuracy of a correction shape of a surface to be inspected regardless of possible positional deviation of both of an absolute shape of a reference surface and a relative shape therepf on a screen and any difference in photographing magnification and measuring instrument by carrying out a coordination conversion of a function according to the absolute shape based on a difference in measuring conditions pertaining to a coordinate in the measurement of the relative shape and the absolute shape at a state prior to the computation made to subtract the absolute shape from 'a surface to be inspected-the relative shape of the reference surface' obtained using an interferometer. SOLUTION: Prior to the computation made to subtract an absolute shape of a reference surface from 'a surface to be inspected-a relative shape of the reference surface' obtained using an interferometer, measuring conditions pertaining to a coordinate in the main measurement made for the relative shape are compared with measuring conditions pertaining to a coordinate in the preliminary measurement made for the shape of the reference surface and based on the results of the comparison, a function a (x, y) corresponding to the shape of the reference surface 2a obtained by the preliminary measurement is converted to a function a' (x, y) on the coordinate in the main measurement so that both the shapes are set to correspond to each other on the same coordinate in a screen.
申请公布号 JP2001208518(A) 申请公布日期 2001.08.03
申请号 JP20000021249 申请日期 2000.01.31
申请人 FUJI PHOTO OPTICAL CO LTD 发明人 UEKI NOBUAKI
分类号 G01B11/24;(IPC1-7):G01B11/24 主分类号 G01B11/24
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