发明名称 SEMICONDUCTOR DEVICE HAVING PROTECTION UNIT FROM ELECTROSTATIC DISCHARGE
摘要 PURPOSE: A semiconductor device is provided to improve a reliance of a device operation by preventing fin capacitance from being increased through formation of an opposite conductive impurity area only on the edge portion. CONSTITUTION: A P-well(12) is formed on a substrate(10). A field oxide(14) is formed on the portion of the P-well(12). An n+ type diffusion area(16) is formed on the both sides of the field oxide(14) with a rectangular shape having a round edge. A p+ type impurity area(18) is formed between one side of the field oxide(14) and the n+ type diffusion area(16). Vss which is connected to the other n+ type diffusion area(16). The p+ type impurity area(18) is able to be formed before the step of forming the n+ type diffusion area(16) or after the step of forming the n+ type diffusion area(16).
申请公布号 KR100305013(B1) 申请公布日期 2001.07.25
申请号 KR19970077387 申请日期 1997.12.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 HWANG, JEONG YEOL
分类号 H01L27/06;(IPC1-7):H01L27/06 主分类号 H01L27/06
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