发明名称 |
SEMICONDUCTOR DEVICE HAVING PROTECTION UNIT FROM ELECTROSTATIC DISCHARGE |
摘要 |
PURPOSE: A semiconductor device is provided to improve a reliance of a device operation by preventing fin capacitance from being increased through formation of an opposite conductive impurity area only on the edge portion. CONSTITUTION: A P-well(12) is formed on a substrate(10). A field oxide(14) is formed on the portion of the P-well(12). An n+ type diffusion area(16) is formed on the both sides of the field oxide(14) with a rectangular shape having a round edge. A p+ type impurity area(18) is formed between one side of the field oxide(14) and the n+ type diffusion area(16). Vss which is connected to the other n+ type diffusion area(16). The p+ type impurity area(18) is able to be formed before the step of forming the n+ type diffusion area(16) or after the step of forming the n+ type diffusion area(16).
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申请公布号 |
KR100305013(B1) |
申请公布日期 |
2001.07.25 |
申请号 |
KR19970077387 |
申请日期 |
1997.12.29 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
HWANG, JEONG YEOL |
分类号 |
H01L27/06;(IPC1-7):H01L27/06 |
主分类号 |
H01L27/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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