发明名称 Metal-insulator-metal capacitor for copper damascene process and method of forming the same
摘要 A capacitor structure formed on a semiconductor substrate may include a first interconnect wiring (such as copper damascene) and a first conductive barrier layer in contact with the first interconnect wiring. A first capacitor plate, a capacitor dielectric structure and a second capacitor plate may also be included over the first conductive barrier layer. A second conductive barrier layer may be formed on the second capacitor plate and a second planar insulating structure may be formed over the second capacitor plate. Finally, a second interconnect wiring may be embedded within a second planar insulator structure.
申请公布号 US6259128(B1) 申请公布日期 2001.07.10
申请号 US19990298122 申请日期 1999.04.23
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 ADLER ERIC;TROMBLEY HENRY W.
分类号 H01L21/02;H01L21/768;(IPC1-7):H01L29/72 主分类号 H01L21/02
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