| 摘要 |
PURPOSE: To provide a method and a device for coin inspection which can inspect an object coin with high precision by extracting much information from the detection signal waveform of a sensor. CONSTITUTION: To inspect a coin 3 by arranging a magnetic sensor 2 along a coin passage 1 that the coin 3 passes through and inspecting the coin 3 according to the detection signal waveform 10 of the magnetic sensor 2, the differential waveform 11 of the detection signal waveform 10 of the magnetic sensor 2 is found, 1st information showing the peak position of the differential waveform 11, 2nd information showing the value of the detection signal waveform at the peak position of the differential waveform 11, and 3rd information showing the value of the differential waveform 11 at the peak position of the differential waveform 11 are extracted, and the coin 3 is inspected by using the 1st to 3rd pieces of extracted information.
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