发明名称 DEVICE FOR MONITORING INTERNAL SOURCE
摘要 PURPOSE: A device for monitoring an internal source is provided to decrease a chip size by monitoring an internal source without a probe pad. CONSTITUTION: A device for monitoring an internal source includes numerous internal source monitoring control parts(11 to 15), numerous address pads(21 to 25), and numerous address buffering part(31 to 35). The numerous internal source monitoring control parts(11 to 15) receives internal sources(Vint, Vcore, Vblp, Vcp, Vpp) according to a test mode control signal(test_mode) for discriminating a normal operation mode and a test mode, and controls a monitoring about the internal sources. The numerous address pads(21 to 25) are connected to each of output terminals of the numerous internal source monitoring control parts(11 to 15). The numerous address buffering part(31 to 35) are connected to each of output terminals of the numerous address pads(21 to 25), and controls an existing of an enabling under a control of the test mode control signal(test_mode), and perform a buffering of external signals transmitted from the numerous address pads(21 to 25).
申请公布号 KR20010061603(A) 申请公布日期 2001.07.07
申请号 KR19990064099 申请日期 1999.12.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, SEONG UK;LEE, JUN GEUN
分类号 G11C29/00;(IPC1-7):G11C29/00 主分类号 G11C29/00
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