发明名称 SOI bonding structure
摘要 A semiconductor substrate adapted to giga-scale integration (GSI) comprises a support, at least the surface of which is made of semiconductor, an electroconductive material layer, an insulating layer and a semiconductor layer arranged sequentially in the above order. The electroconductive material layer has at least in part thereof an electroconductive reacted layer obtained by causing two metals, a metal and a semiconductor, a metal and a metal-semiconductor compound, a semiconductor and a metal-semiconductor compound, or two metal-semiconductor compounds to react each other. An electroconductive reaction terminating layer that is made of a material that does not react with the reacted layer is arranged between the reacted layer and the insulating layer or the support.
申请公布号 US6255731(B1) 申请公布日期 2001.07.03
申请号 US19980123364 申请日期 1998.07.28
申请人 CANON KABUSHIKI KAISHA;OHMI TADAHIRO;ULTRACLEAN TECHNOLOGY RESEARCH INSTITUTE 发明人 OHMI TADAHIRO;TANAKA NOBUYOSHI;USHIKI TAKEO;SHINOHARA TOSHIKUNI;NITTA TAKAHISA
分类号 H01L21/20;H01L21/762;H01L23/482;(IPC1-7):H01L23/48 主分类号 H01L21/20
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