发明名称 METHOD FOR FORMING METAL LAYER OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming a metal layer of a semiconductor device is provided to reduce a time for semiconductor manufacturing process by omitting an ashing process for a photoresist pattern and a water cleaning process for a semiconductor substrate after performing the ashing process. CONSTITUTION: A metal is laminated on a semiconductor substrate formed with a contact hole. The laminated metal is etched by using a photoresist pattern. The first ashing process for the photoresist pattern is performed. A water cleaning process for the semiconductor substrate ashen with the photoresist pattern is performed. The second ashing process for the photoresist pattern is performed.
申请公布号 KR20010055077(A) 申请公布日期 2001.07.02
申请号 KR19990056146 申请日期 1999.12.09
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 DO, SEONG WON;KIM, YEONG GYU
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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