发明名称 |
METHOD FOR FORMING METAL LAYER OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for forming a metal layer of a semiconductor device is provided to reduce a time for semiconductor manufacturing process by omitting an ashing process for a photoresist pattern and a water cleaning process for a semiconductor substrate after performing the ashing process. CONSTITUTION: A metal is laminated on a semiconductor substrate formed with a contact hole. The laminated metal is etched by using a photoresist pattern. The first ashing process for the photoresist pattern is performed. A water cleaning process for the semiconductor substrate ashen with the photoresist pattern is performed. The second ashing process for the photoresist pattern is performed.
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申请公布号 |
KR20010055077(A) |
申请公布日期 |
2001.07.02 |
申请号 |
KR19990056146 |
申请日期 |
1999.12.09 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
DO, SEONG WON;KIM, YEONG GYU |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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