发明名称 |
Semiconductor structure used in integrated circuits comprises conducting pathway folded in trenches in such a way that its length within each trench is double depth of trench |
摘要 |
A semiconductor structure comprises a substrate (10); one or more trenches (15a-d) arranged in the substrate; and a conducting pathway (30) with a first connection (A1) on a first end and a second connection (A2) on a second end. The conducting pathway is folded in the trenches in such a way that its length within each trench is double the depth of the trench. An Independent claim is also included for the production of a semiconductor structure comprising preparing the substrate; forming the trenches; forming a first insulating layer on the substrate and on the trench walls and bases; forming the conducting pathway on the insulating layer; forming a second insulating layer on the conducting pathway; filling the trenches; forming a third insulating layer on the conducting pathway; and forming connections through the third insulating layer.
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申请公布号 |
DE19960563(A1) |
申请公布日期 |
2001.06.28 |
申请号 |
DE19991060563 |
申请日期 |
1999.12.15 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
PFIRSCH, FRANK;LASKA, THOMAS |
分类号 |
H01L21/334;H01L27/08;(IPC1-7):H01L27/08;H01L21/822 |
主分类号 |
H01L21/334 |
代理机构 |
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代理人 |
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地址 |
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