Semi-conductor test system has a test head that can be used with different test device modules for use with DUTs of different performance and clocking properties,

摘要

Test system comprises a test head for reception of two or more test device modules with different capacities, a device for electrically connecting the test device module to the device under test (DUT) and a main computer that controls data exchange between the test device modules and overall operation of the test system. Typically one test module will be a high performance, high time resolution device, while a second test module will be a low performance, low time resolution module. The device for connecting test device modules and a DUT includes a performance board and a connection mechanism. Each event testing module has its own test device circuit board.