发明名称 METHOD AND APPARATUS FOR EVALUATING LIQUID CRYSTAL DISPLAY ELEMENT
摘要 PROBLEM TO BE SOLVED: To determine the twist angle and the tilt angle of a liquid crystal molecule in a liquid crystal display element, and the thickness of a liquid crystal layer. SOLUTION: A liquid crystal display element evaluating apparatus comprises an in-plane rotation mechanism of a sample 103, a light source of a plurality of wavelengths, a polarizer 102 to control the polarized state of the light incident in a sample, a phase operator to measure the polarized state of the light transmitted through the sample, an analyzer 105, a spectroscope to realize the monochromactic specification of the light wavelength, and a photodetector 106. The twist angle of the liquid crystal molecule in the liquid crystal display element, the thickness of the liquid crystal layer, or the twist angle, the mean angle of inclination and the thickness of the liquid crystal layer are determined by measuring the sample azimuth and the wavelength dispersion dependency of the polarized state of the light transmitted through the sample.
申请公布号 JP2001165809(A) 申请公布日期 2001.06.22
申请号 JP19990345107 申请日期 1999.12.03
申请人 NEC CORP 发明人 HIROZAWA ICHIRO
分类号 G01N21/21;G01M11/00;G01N21/01;G01N21/27;G01N21/95;G02F1/13;(IPC1-7):G01M11/00 主分类号 G01N21/21
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