| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a micro-controller and a test method which can shorten accurately a test time. SOLUTION: In a micro-controller having a memory 100 constituted of memory cells 150-170 and performing a test of a memory 100 by a test input applied to memory cells 150, 154, 158, 162, 167 being an object of read-out at the time of testing a memory 100, and the device is provided with a detecting means consisting of counters 201, 202, 203 detecting the number of memory cells holding data out of plural memory cells which are made an active state by applying a test input to memory cells 150, 154, 158, 162, 167 being an object of read-out at the time of the test.</p> |
