发明名称 INTEGRATED PACKAGING OF MICROMECHANICAL SENSORS AND CONTROL CIRCUITS
摘要 A micromechanical sensor (42) is fabricated on a first semiconductor wafer (40), and a control circuit is fabricated on a front side of a second wafer (30). A cavity (36) is formed on the backside of the second wafer, the cavit y is being formed such that the sensor on the wafer fits within the cavity whe n the wafers are brought together in an adjoining relationship. Through-holes (34) are etched through the backside of the second wafer to allow access to electrical points and a patterned layer (38) is deposited to form electrical interconnections between electrical contact points and terminal points on th e backside of the wafer via through-holes. The two wafers are cleaned and bond ed together. The bonded wafers are diced to yield individual bonded sensor- control circuit pairs.
申请公布号 CA2388265(A1) 申请公布日期 2001.04.26
申请号 CA20002388265 申请日期 2000.10.17
申请人 THE CHARLES STARK DRAPER LABORATORY, INC. 发明人 MARINIS, THOMAS F.;TUMMINELLI, RICHARD P.;SOHN, JEROME B.
分类号 B81B7/00;G01P1/02;G01P15/08;(IPC1-7):H01L21/302;H01L21/48;H01L21/52;H01L21/60;H01L21/70;H01L23/02;H01L29/84 主分类号 B81B7/00
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