发明名称 |
INTEGRATED PACKAGING OF MICROMECHANICAL SENSORS AND CONTROL CIRCUITS |
摘要 |
A micromechanical sensor (42) is fabricated on a first semiconductor wafer (40), and a control circuit is fabricated on a front side of a second wafer (30). A cavity (36) is formed on the backside of the second wafer, the cavit y is being formed such that the sensor on the wafer fits within the cavity whe n the wafers are brought together in an adjoining relationship. Through-holes (34) are etched through the backside of the second wafer to allow access to electrical points and a patterned layer (38) is deposited to form electrical interconnections between electrical contact points and terminal points on th e backside of the wafer via through-holes. The two wafers are cleaned and bond ed together. The bonded wafers are diced to yield individual bonded sensor- control circuit pairs.
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申请公布号 |
CA2388265(A1) |
申请公布日期 |
2001.04.26 |
申请号 |
CA20002388265 |
申请日期 |
2000.10.17 |
申请人 |
THE CHARLES STARK DRAPER LABORATORY, INC. |
发明人 |
MARINIS, THOMAS F.;TUMMINELLI, RICHARD P.;SOHN, JEROME B. |
分类号 |
B81B7/00;G01P1/02;G01P15/08;(IPC1-7):H01L21/302;H01L21/48;H01L21/52;H01L21/60;H01L21/70;H01L23/02;H01L29/84 |
主分类号 |
B81B7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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