WORK PRESS FOR TESTING SEMICONDUCTOR PACKAGE

摘要

PURPOSE: A work press for testing a semiconductor package is provided to improve a contact characteristic of a contact pin of a socket and the semiconductor package and to prevent a contactor of the work press from being damaged. CONSTITUTION: A work press(1) for testing a semiconductor package has a connecting table(2) for connection with a handler. A contactor holder(3) is coupled to the connecting table. A contactor(4) is coupled to a lower surface of an end portion of the contact holder. The contactor is fixed by a fixing pin(6) penetrating both sides of the contactor holder while the contactor is inserted into a groove(5) formed the lower surface of the end portion of the contactor holder.