发明名称 Controlling packaging encapsulant leakage
摘要 An integrated circuit package may be formed in part with an encapsulated region. Outflow of the encapsulant across critical electrical elements can be prevented by providing a cavity which collects encapsulant outflow between the region of encapsulation and the region where the critical components are situated. In one embodiment of the present invention, a surface may include a first portion covered by solder resist, having an area populated by bond pads, and a second portion which is encapsulated. Encapsulant flow over the bond pads is prevented by forming an opening in the solder resist proximate to the second portion to collect the encapsulant before it reaches the bond pads.
申请公布号 US6210992(B1) 申请公布日期 2001.04.03
申请号 US19990386971 申请日期 1999.08.31
申请人 MICRON TECHNOLOGY, INC. 发明人 TANDY PATRICK W.;BRAND JOSEPH M.;RUMSEY BRAD D.;STEPHENSON STEVEN R.;CORISIS DAVID J.;BOLKEN TODD O.;SCHROCK EDWARD A.;DICKEY BRENTON L.
分类号 H01L21/56;H01L23/31;H01L23/498;(IPC1-7):H01L21/44;H01L21/48;H01L21/50 主分类号 H01L21/56
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