| 摘要 |
The present invention provides a gold alloy thin wire for semiconductor devices, which inhibits corrosion after heating and which improves long term reliability, in portions bonded to the aluminum electrodes.The gold alloy thin wires of the present invention comprise the following group elements.(1) The gold alloy thin wire contains, as basic alloying components, 0.005 to 0.3% by weight of Mn and 0.005 to 1.0% by weight of Pd.(2) A gold alloy thin wire further contains at least one element selected from Pt, Ag and Cu in a total amount of 0.01 to 1.0% by weight in addition to the basic alloying components mentioned above.(3) A gold alloy thin wire further contains at least one element selected from Ca, Be, In and rare earth elements in a total amount of 0.0005 to 0.05% by weight in addition to the components in (1) or (2).
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