发明名称 BURN-IN BOARD OF SEMICONDUCTOR IC
摘要 PROBLEM TO BE SOLVED: To easily and securely suppress noise which is easy to generate, specially, between a socket substrate and an inspection substrate as to the constitution of the burn-in board of a semiconductor IC. SOLUTION: This burn-in board is constituted including a socket substrate 22 on which an IC socket 222 is mounted, an inspection substrate 21 which is sized corresponding to multiple socket substrates, and a connector device 23 connecting the socket substrate 22 and inspection substrate 21. The connector device is composed of a plug connector 235 mounted on the socket substrate and a jack connector 231 mounted on the inspection substrate.
申请公布号 JP2001066345(A) 申请公布日期 2001.03.16
申请号 JP19990242265 申请日期 1999.08.27
申请人 FUJITSU LTD 发明人 KOBASHI NAOTO;KUMAZAWA KATSUMI;KITAOKA TOMOKAZU;YOSHIOKA HIROYUKI
分类号 G01R31/26;(IPC1-7):G01R31/26 主分类号 G01R31/26
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